Technologies of radiation hardness for deep submicron semiconductor devices; Development of rad-hard high-speed logic circuit using SOI technology

Shindo, Hiroyuki*; Sato, Yohei*; Midorikawa, Masahiko*; Kuboyama, Satoshi*; Makihara, Akiko*; Hirao, Toshio; Ito, Hisayoshi

no abstracts in English

Language	:	Japanese
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Meeting title	:	第1回高崎量子応用研究シンポジウム
Held date	:	2006/06
Location (city)	:	高崎
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Cooperating Institute	:	宇宙航空研究開発機構

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Registration No. : BB20060824
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