Qualitative analysis of -ray irradiation effect on the characteristics of P type 6H-SiC schottky diodes

Sudjadi, U.; Iwamoto, Naoya; Hishiki, Shigeomi; Oshima, Takeshi; Kawano, Katsuyasu*

no abstracts in English

Language	:	Japanese
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Meeting title	:	シリコンカーバイド(SiC)及び関連ワイドギャップ半導体研究会第15回講演会
Held date	:	2006/11
Location (city)	:	高崎
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	コバルト60照射施設
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Registration No. : BB20062405
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