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Numerical analysis of primary electrons in a tandem-type negative ion source

タンデム型負イオン源における高速電子の数値解析

加藤 恭平*; 高戸 直之*; 畑山 明聖*; 花田 磨砂也; 関 孝義; 井上 多加志

Kato, Kyohei*; Takado, Naoyuki*; Hatayama, Akiyoshi*; Hanada, Masaya; Seki, Takayoshi; Inoue, Takashi

タンデム型負イオン源におけるプラズマの非一様性発生の原因を明らかにするため、フィラメント陰極より放出された一次電子の軌道解析を行った。モンテカルロ法を用いた3次元輸送コードを、実形状の磁場分布を考慮したJAEA10アンペア負イオン源に適用した。また、中性粒子との主な非弾性衝突反応も合わせて考慮した。その結果、ドライバ領域の高速電子はドリフトにより引出し領域へと失われ得ること、及びそのドリフト方向は負イオン源上下端で逆方向となることが明らかになった。

To clarify physics mechanism of plasma spatial nonuniformity observed in tandem-type negative-ion sources, primary electron-transport process has been analyzed by a three-dimensional Monte Carlo simulation code. In the model, equations of motion for electrons are numerically solved. Geometry and magnetic-field configuration of the JAEA 10 Ampere negative ion source are taken into account. Various collision processes with neutral particles are also included in the model. The simulation results show that (1) the primary electrons have been lost from the source region to the extraction region due to magnetic drift in the magnetic filter, and then (2) there is another magnetic drift near the sidewalls, where a sum of magnetic field of the filter and the cusp field for plasma confinement allows electron drift towards the extraction region. A sequence of these magnetic drifts would increase the electron temperature in local area of extraction region, which resulted in loss of negative ions.

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パーセンタイル:43.02

分野:Instruments & Instrumentation

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