Electron irradiation-induced defects in ZnO studied by positron annihilation

Chen, Z. Q.*; Maekawa, Masaki; Kawasuso, Atsuo; Sakai, Seiji; Naramoto, Hiroshi

no abstracts in English

Language	:	English
Journal	:	Physica B; Condensed Matter
Volume	:	376-377
Number	:
Pages	:	p.722 - 725
Publication Year/Month	:	2006/04
Meeting title	:	23rd International Conference on Defects in Semiconductors (ICDS-23)
Held date	:	2005/07
Location (city)	:	Awaji
Location (country)	:	Japan
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/j.physb.2005.12.181
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	電子加速器
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:62.98 Category:Physics, Condensed Matter
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Registration No. : BB20063433
JAEA Abstracts No. : 35000590
Paper Submission No. : 2066

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