Inner-shell ionization in Xe clusters irradiated with X-ray laser pulse

Namba, Shinichi*; Hasegawa, Noboru; Nishikino, Masaharu; Kawachi, Tetsuya; Kishimoto, Maki; Tanaka, Momoko; Ochi, Yoshihiro; Nagashima, Keisuke; Takiyama, Ken*

The interaction of large xenon clusters with an X-ray laser pulse having a wavelength of 13.9 nm and intensity of up to 210 $^{10}$ W/cm $^{2}$ was investigated using a time-of-flight ion mass spectrometer. The photon energy is high enough to photoionize the inner-shell electron of the Xe atom. In contrast to the experiment at synchrotron radiation, the enhancement of double Auger decay probability with increasing cluster size and X-ray laser intensity was observed for the first time.

Language	:	English
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Meeting title	:	10th International Conference on X-ray Lasers (ICXRL 2006)
Held date	:	2006/08
Location (city)	:	Berlin
Location (country)	:	Germany
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Keywords	:	no keyword
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Registration No. : BB20070054
JAEA Abstracts No. :
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