Analysis of transport properties of charge induced in SOI structure devices by heavy ion irradiation

Onishi, Kazunori*; Takahashi, Yoshihiro*; Nakajima, Yasuhito*; Nagasawa, Takaharu*; Fugane, Masaru; Imagawa, Ryo*; Nomoto, Keisuke*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no abstracts in English

Language	:	Japanese
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Meeting title	:	第2回高崎量子応用研究シンポジウム
Held date	:	2007/06
Location (city)	:	高崎
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Article of JAEA R&D Review	:
Cooperating Institute	:	日本大学

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Registration No. : BB20071346
JAEA Abstracts No. :
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