Application of double-sided silicon strip detectors for a Si/CdTe Compton camera

Aono, Hiroyuki*; Takeda, Shinichiro*; Ishikawa, Shinnosuke*; Odaka, Hirokazu*; Kokubun, Motohide*; Watanabe, Shin*; Takahashi, Tadayuki*; Nakazawa, Kazuhiro*; Okuyama, Sho*; Tajima, Hiroyasu*; Fukazawa, Yasushi*; Kawachi, Naoki

We have developed a low noise double-sided silicon strip detector for hard X-ray imaging spectroscopy. Development of low-noise analog electronics, optimized double-sided silicon strip detectors and a compact assembly technology realized the high-quality X-ray imaging device with fine energy, position and timing resolutions, and good uniformity. Imaging detectors in 10-100 keV would be attractive in various fields such as astrophysics, medical and nondestructive inspection. For these purposes, the development the next generation Compton Camera is now underway.

Language	:	English
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Meeting title	:	SPIE Astronomical Instrumentation 2008
Held date	:	2008/06
Location (city)	:	Marseille
Location (country)	:	France
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Keywords	:	no keyword
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Cooperating Institute	:	宇宙航空研究開発機構

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Registration No. : BB20081010
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