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Application of double-sided silicon strip detectors for a Si/CdTe Compton camera

両面ストリップシリコン半導体検出器を用いたシリコンカドテルコンプトンカメラ

青野 博之*; 武田 伸一郎*; 石川 真之介*; 小高 裕和*; 国分 紀秀*; 渡辺 伸*; 高橋 忠幸*; 中澤 知洋*; 奥山 翔*; 田島 宏康*; 深沢 泰司*; 河地 有木

Aono, Hiroyuki*; Takeda, Shinichiro*; Ishikawa, Shinnosuke*; Odaka, Hirokazu*; Kokubun, Motohide*; Watanabe, Shin*; Takahashi, Tadayuki*; Nakazawa, Kazuhiro*; Okuyama, Sho*; Tajima, Hiroyasu*; Fukazawa, Yasushi*; Kawachi, Naoki

We have developed a low noise double-sided silicon strip detector for hard X-ray imaging spectroscopy. Development of low-noise analog electronics, optimized double-sided silicon strip detectors and a compact assembly technology realized the high-quality X-ray imaging device with fine energy, position and timing resolutions, and good uniformity. Imaging detectors in 10-100 keV would be attractive in various fields such as astrophysics, medical and nondestructive inspection. For these purposes, the development the next generation Compton Camera is now underway.

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