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As-rich InAs(001)-(2$$times$$4) phases investigated by ${it in situ}$ surface X-ray diffraction

Tinkham, B. P.*; Braun, W.*; Ploog, K. H.*; Takahashi, Masamitsu; Mizuki, Junichiro; Grosse, F.*

Surface X-ray diffraction has been employed, in situ, to measure InAs(001)-(2$$times$$4) surface phases under technologically relevant growth conditions. For the As-rich (2$$times$$4) phase, the authors obtain good agreement between the data and the $$beta$$2(2$$times$$4) surface reconstruction model. Comparison of our measurements on the (2$$times$$4) phase measured close to the metal-rich phase transition to models from density functional theory suggests a mixture of $$alpha$$2(2$$times$$4) and $$beta$$2(2$$times$$4) surface structures present on the surface.

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Category:Engineering, Electrical & Electronic

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