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Report No.

Magnetic structure analysis of magnetic multilayers using neutron reflectometry

Hirano, Tatsumi*; Takeda, Masayasu

The characterization of a magnetic interface structure in magnetic multilayer is important for producing good magnetic devices because the device properties strongly depend on the structure. In this report we review a polarized neutron reflectometry to analyze the magnetic interface structure and also mention a future prospect of a neutron experiment.



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