Magnetic structure analysis of magnetic multilayers using neutron reflectometry

Hirano, Tatsumi*; Takeda, Masayasu

The characterization of a magnetic interface structure in magnetic multilayer is important for producing good magnetic devices because the device properties strongly depend on the structure. In this report we review a polarized neutron reflectometry to analyze the magnetic interface structure and also mention a future prospect of a neutron experiment.

Language	:	Japanese
Journal	:	Magune
Volume	:	4
Number	:	1
Pages	:	p.38 - 42
Publication Year/Month	:	2009/01
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Paper URL	:	https://ci.nii.ac.jp/naid/10024834686
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Keywords	:	no keyword
Research Facility	:	JRR-3M(研究炉3)
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Article of JAEA R&D Review	:
Cooperating Institute	:	日立製作所

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Registration No. : AA20080508
JAEA Abstracts No. : 37000180
Paper Submission No. : 5160

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