Development of secondary ion mass spectroscopy using medium energy C $_{60}$ ion impact

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Adachi, Masahiro*; Yamada, Keisuke; Narumi, Kazumasa

Time-of-flight (TOF) secondary ion mass spectroscopy was performed using primary C $_{60}$ ions with an energy range from several tens of keV to several hundreds of keV. Application of the spectroscopy to the analysis of a poly(amino acid) film revealed that characteristic peaks, necessary for identification of the amino acid in proteins, show higher intensities for medium energy C $_{60}$ (120 keV C $_{60}^{+}$ and 540 keV C $_{60}^{2+}$ ) impacts than those for low energy C $_{60}$ (30 keV C $_{60}^{+}$ ) impacts. This finding demonstrates that medium energy C $_{60}$ ion impacts are useful for highly sensitive characterization of amino acids.

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	266
Number	:	10
Pages	:	p.2450 - 2452
Publication Year/Month	:	2008/05
Meeting title	:	9th European Conference on Accelerators in Applied Research and Technology (ECAART-9)
Held date	:	2007/09
Location (city)	:	Florence
Location (country)	:	Italy
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/j.nimb.2008.03.019
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	産業技術総合研究所

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InCites™	:	Percentile:64.63 Category:Instruments & Instrumentation
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Registration No. : BB20083641
JAEA Abstracts No. : 37000310
Paper Submission No. : 5337

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Development of secondary ion mass spectroscopy using medium energy C ion impact

Development of secondary ion mass spectroscopy using medium energy C $_{60}$ ion impact