Valence states and their diffusion at the Si-SiO $_{2}$ interface observed by micro-X-ray absorption spectroscopy

Hirao, Norie; Baba, Yuji ; Sekiguchi, Tetsuhiro ; Shimoyama, Iwao ; Honda, Mitsunori ; Narita, Ayumi

no abstracts in English

Language	:	Japanese
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Meeting title	:	日本化学会第89春季年会(2009)
Held date	:	2009/03
Location (city)	:	船橋
Location (country)	:	日本
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Registration No. : BB20083734
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Valence states and their diffusion at the Si-SiO interface observed by micro-X-ray absorption spectroscopy

Valence states and their diffusion at the Si-SiO $_{2}$ interface observed by micro-X-ray absorption spectroscopy