Chemical-state resolved depth-profiling using angle-resolved X-ray photoelectron spectroscopy and the maximum entropy method

Harries, J.; Tode, Mayumi; Sumimoto, Yuichi; Inoue, Keisuke; Yoshigoe, Akitaka ; Teraoka, Yuden

Using the high energy resolution surface chemistry apparatus at SPring-8's BL23SU it is possible to record angular and chemical-state resolved X-ray photoelectron spectra. Chemical-state specific depth profile information can be obtained from these spectra using the maximum entropy method. Here we describe progress made in the combination of these two techniques, with the specific example of the depth-profiling of various nitridation states present in a Al(111) sample nitrided using a supersonic molecular beam.

Language	:	English
Journal	:
Volume	:
Number	:
Pages	:
Publication Year/Month	:
Meeting title	:	International Workshop on Electronic Spectroscopy for Gas-phase Molecules and Solid Surfaces
Held date	:	2009/10
Location (city)	:	Matsushima
Location (country)	:	Japan
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	SPring-8(大型放射光施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : BB20091291
JAEA Abstracts No. :
Paper Submission No. :

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.