Complementary spectroscopy of tin ions using ion and electron beams

Ohashi, Hayato*; Suda, Shintaro*; Tanuma, Hajime*; Fujioka, Shinsuke*; Nishimura, Hiroaki*; Nishihara, Katsunobu*; Kai, Takeshi   ; Sasaki, Akira; Sakaue, Hiroyuki*; Nakamura, Nobuyuki*; Otani, Shunsuke*

Extreme ultra-violet (EUV) emission spectra of multiply charged tin ions were measured in the wavelength range of 10-22 nm following charge exchange collisions or the electron impact excitation of tin ions. In charge exchange collisions, we observed both the resonance lines and the emission lines corresponding to the transitions between the excited states. On the other hand, we observed mainly the resonance lines in the electron impact experiments. We can distinguish the resonance lines from other emission lines in the charge exchange spectrum by comparison with the emission lines in the electron impact spectrum.