Refine your search:     
Report No.
 - 

Metrology of wide field of view nano-thickness foils' homogeneity by conventional and phase contrast soft X-ray imaging

Faenov, A. Y.; Pikuz, T.*; Fukuda, Yuji; Kando, Masaki; Kotaki, Hideyuki; Homma, Takayuki; Kawase, Keigo; Skobelev, I.*; Gasilov, S.*; Kawachi, Tetsuya; Daido, Hiroyuki; Tajima, Toshiki*; Kato, Yoshiaki* ; Bulanov, S. V.

New approach for phase-contrast imaging of nanostructures using compact femtosecond laser-produced cluster plasma devices. Novel ultrafast soft X-ray diagnostics and metrology of full areas of free standing or mesh supported nano- thickness foils or other nanostructures is demonstrated.

Accesses

:

- Accesses

InCites™

:

Percentile:34.38

Category:Physics, Applied

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.