A New evaluation technology for single event effects on space use SOI devices

Kobayashi, Daisuke*; Hirose, Kazuyuki*; Makino, Takahiro; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi

no abstracts in English

Language	:	Japanese
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Meeting title	:	第4回高崎量子応用研究シンポジウム
Held date	:	2009/10
Location (city)	:	高崎
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Article of JAEA R&D Review	:
Cooperating Institute	:	宇宙航空研究開発機構

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Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
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Registration No. : BB20092425
JAEA Abstracts No. :
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