Study of thermal stability on surface of deuteration VCrTi by high resolution soft X-ray synchrotron radiation photoemission spectroscopy

Tode, Mayumi; Harries, J.; Teraoka, Yuden; Sumimoto, Yuichi; Inoue, Keisuke; Yoshigoe, Akitaka 

Thermal stability of native oxide layer on the hydrogen storage materials is related to the hydrogen absorption and desorption. In this study, thermal degradation process of native oxide layer on VCrTi was observed by high resolution soft X-ray synchrotron radiation photoemission spectroscopy. All experiments have been conducted at the surface chemistry experimental station (SUREAC2000) at BL23SU, SPring-8. Before thermal annealing, photoemission spectrum of oxide was observed. After thermal annealing, the oxide peak was decreased, and the metal peak was increased. When the deuterium ion was implanted into the surface, the degeneration temperature of a natural oxide layer was observed to rise about 100 degrees.