Charge enhancement effects in 6H-SiC MOSFETs induced by heavy ion strike

Onoda, Shinobu; Makino, Takahiro; Iwamoto, Naoya*; Vizkelethy, G.*; Kojima, Kazutoshi*; Nozaki, Shinji*; Oshima, Takeshi

no abstracts in English

Language	:	English
Journal	:	IEEE Transactions on Nuclear Science
Volume	:	57
Number	:	6
Pages	:	p.3373 - 3379
Publication Year/Month	:	2010/12
Meeting title	:	2010 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2010)
Held date	:	2010/07
Location (city)	:	Denver
Location (country)	:	U.S.A.
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DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	Sandia National Laboratories; 産業技術総合研究所; 電気通信大学

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Registration No. : BB20100142
JAEA Abstracts No. : 39000344
Paper Submission No. : 8575

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