Characterization of microdose damage caused by single heavy ion observed in trench type power MOSFETs

Kuboyama, Satoshi*; Maru, Akifumi*; Ikeda, Naomi*; Hirao, Toshio; Tamura, Takashi*

no abstracts in English

Language	:	English
Journal	:	IEEE Transactions on Nuclear Science
Volume	:	57
Number	:	6
Pages	:	p.3257 - 3261
Publication Year/Month	:	2010/12
Meeting title	:	2010 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2010)
Held date	:	2010/07
Location (city)	:	Denver
Location (country)	:	U.S.A.
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1109/TNS.2010.2081686
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	宇宙航空研究開発機構

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:72.36 Category:Engineering, Electrical & Electronic
Altmetrics	:

Registration No. : BB20102278
JAEA Abstracts No. :
Paper Submission No. : 10618

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