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Soft X-ray angle-resolved photoemission study of YbCu$$_2$$Ge$$_2$$

Yasui, Akira; Fujimori, Shinichi  ; Kawasaki, Ikuto ; Okane, Tetsuo ; Takeda, Yukiharu  ; Saito, Yuji ; Yamagami, Hiroshi; Sekiyama, Akira*; Settai, Rikio*; Matsuda, Tatsuma; Haga, Yoshinori ; Onuki, Yoshichika*

Soft X-ray photoemission spectroscopies have been performed on YbCu$$_2$$Ge$$_2$$, which is thought to be a Yb divalent system, to investigate its bulk electronic structure including Yb 4$$f$$ electrons. Small but finite Yb$$^{3+}$$ multiplet peaks were found at 6$$sim$$12 eV in the angle-integrated spectrum, suggesting that it is a valence fluctuation compound. An "anti-crossing" Yb 4$$f$$ bands with conduction bands were observed in the angle-resolved spectrum. This is the evidence that the Yb 4$$f$$ electrons form a band state through the hybridization with Ge 4$$p$$ and Cu 3$$d$$ electrons.

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