Feasibility study on a 90 nm bulk CMOS process for applicability to space environments

Maru, Akifumi*; Kuboyama, Satoshi*; Shindo, Hiroyuki*; Ikeda, Naomi*; Tamura, Takashi*; Hirao, Toshio; Abe, Hiroshi; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi

no abstracts in English

Language	:	Japanese
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Meeting title	:	第5回高崎量子応用研究シンポジウム
Held date	:	2010/10
Location (city)	:	高崎
Location (country)	:	日本
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Keywords	:	no keyword
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Cooperating Institute	:	宇宙航空研究開発機構

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Registration No. : BB20102621
JAEA Abstracts No. :
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