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Report No.

Synchrotron radiation based X-ray imaging study of simulated high-level waste glass

Okamoto, Yoshihiro  ; Nakada, Masami  ; Akabori, Mitsuo; Minato, Kazuo ; Shiwaku, Hideaki   ; Yaita, Tsuyoshi; Komamine, Satoshi*; Fukui, Toshiki*; Ochi, Eiji*; Nitani, Hiroaki*; Nomura, Masaharu*

Distribution and the chemical state of Ru element in the simulated high-level waste glass were examined by using the synchrotron radiation based X-ray imaging technique. In this technique, a direct X-ray CCD camera is used in place of an ion chamber. Position sensitive X-ray absorption spectra were obtained by analyzing gray scale in images of the X-ray CCD camera. It can be seen that Ru element scattered in the glass sample exists as oxide RuO$$_2$$.



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