Real-time photoemission spectroscopy measurements of initial oxidation process of high-index Si surfaces

Ono, Shinya*; Inoue, Kei*; Morimoto, Masahiro*; Arae, Sadanori*; Toyoshima, Hiroaki*; Yoshigoe, Akitaka ; Teraoka, Yuden; Ogata, Shoichi*; Yasuda, Tetsuji*; Tanaka, Masatoshi*

no abstracts in English

Language	:	Japanese
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Meeting title	:	2011年(平成23年)春季第58回応用物理学関係連合講演会
Held date	:	2011/03
Location (city)	:	厚木
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	SPring-8(大型放射光施設)
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Cooperating Institute	:	横浜国立大学

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Registration No. : BB20103245
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