Nanostructure analyses of organic thin films by photoelectron emission microscopy combined with synchrotron soft X-rays

Baba, Yuji

Photoelectron emission microscopy (PEEM) is a powerful tool to observe microscopic images of a solid surface at nanometer scale. When we use soft X-rays from synchrotron light source in PEEM, electronic structures and molecular orientations can be observed owing to the energy tunability and polarized nature of synchrotron beam. The examples of the application of soft X-ray PEEM to the real-time observation of organic thin films are presented.

Language	:	Japanese
Journal	:	Shokubai
Volume	:	53
Number	:	3
Pages	:	p.160 - 166
Publication Year/Month	:	2011/04
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Paper URL	:	https://cir.nii.ac.jp/crid/1571698600774340736
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Registration No. : AA20100960
JAEA Abstracts No. : 39000755
Paper Submission No. : 8994

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