Evaluation of single event effects in SOI device using heavy ion microbeam

Hirao, Toshio; Onoda, Shinobu; Makino, Takahiro; Takahashi, Yoshihiro*; Takeyasu, Hidenori*; Okazaki, Yuji*; Abo, Satoshi*; Masuda, Naoyuki*; Takai, Mikio*; Oshima, Takeshi

no abstracts in English

Language	:	Japanese
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Meeting title	:	第24回タンデム加速器及びその周辺技術の研究会
Held date	:	2011/07
Location (city)	:	奈良
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Article of JAEA R&D Review	:
Cooperating Institute	:	大阪大学; 日本大学

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Registration No. : BB20110768
JAEA Abstracts No. :
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