A New simple diagnosis method for intense ion beam utilizing back scattered particles with PADC track detectors

Kanasaki, Masato; Yamauchi, Tomoya*; Fukuda, Yuji; Sakaki, Hironao; Hori, Toshihiko*; Tampo, Motonobu; Kondo, Kiminori; Kurashima, Satoshi; Kamiya, Tomihiro

A diagnosis method has been developed utilizing back scattered particles with the single PADC detector for high energy intense ion beams. The PADC detector mounted on the uniform back-scatterer was irradiated with He ions with an energy of 100 MeV, which is never recorded as etchable tracks in PADC. It turns out that most of etch pits in the rear surface are made by the back-scattered particles through the investigation of the growth pattern of each etch pit. This method allows simple diagnosis of the ion beam profile and intensity distribution with wide energy range in mixed radiation fields such as laser-driven ion acceleration experiments.