Fast single-ion hit system for heavy-ion microbeam at TIARA cyclotron, 4

Yokota, Wataru; Sato, Takahiro; Okumura, Susumu; Kurashima, Satoshi; Miyawaki, Nobumasa; Kashiwagi, Hirotsugu; Yoshida, Kenichi; Koka, Masashi; Takano, Katsuyoshi*; Yokoyama, Akihito; Kada, Wataru; Kamiya, Tomihiro

The development of the fast single-ion hit system was continued from last year in order to improve the quality of microbeam and single-ion hit at the TIARA cyclotron of the Japan Atomic Energy Agency. The major subjects were reduction of miss hit, no hit on the targeted point by any ions in the single-ion-hit irradiation, and development of a real-time detection system of single-ion hit. A new microbeam of 400 MeV-Fe with a spot diameter of about 4 m was also developed and supplied to an experiment.