Structural analysis of Si(111)--(Ag, Cs) surface by reflection high-energy positron diffraction

Fukaya, Yuki ; Matsuda, Iwao*; Yukawa, Ryu*; Kawasuso, Atsuo

no abstracts in English

Language	:	English
Journal	:	Surface Science
Volume	:	606
Number	:	23-24
Pages	:	p.1918 - 1921
Publication Year/Month	:	2012/12
Meeting title	:
Held date	:
Location (city)	:
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/j.susc.2012.07.039
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	東京大学

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:14.91 Category:Chemistry, Physical
Altmetrics	:

Registration No. : AA20110943
JAEA Abstracts No. : 41000349
Paper Submission No. : 11991

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.