Detection of deep levels in low-doped n-type 4H-SiC by using alpha particles

Iwamoto, Naoya; Johnson, B. C.; Oshima, Takeshi; Hoshino, Norihiro*; Tsuchida, Hidekazu*

no abstracts in English

Language	:	Japanese
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Meeting title	:	2012年秋季第73回応用物理学会学術講演会
Held date	:	2012/09
Location (city)	:	松山
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	電子加速器
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Article of JAEA R&D Review	:
Cooperating Institute	:	電力中央研究所

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Registration No. : BB20120607
JAEA Abstracts No. :
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