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Vicinage Effect on Secondary-electron Yield from Amorphous Carbon Foils Induced by Swift H$$_{2}$$$$^{+}$$ and C$$_{2}$$$$^{+}$$ Ions

高速H$$_{2}$$$$^{+}$$及びC$$_{2}$$$$^{+}$$イオンによって誘起された非晶質炭素薄膜からの二次電子収量に対する近接効果

鳴海 一雅; 高橋 康之*; 千葉 敦也; 齋藤 勇一; 山田 圭介; 石川 法人   ; 須貝 宏行*; 前田 佳均

Narumi, Kazumasa; Takahashi, Yasuyuki*; Chiba, Atsuya; Saito, Yuichi; Yamada, Keisuke; Ishikawa, Norito; Sugai, Hiroyuki*; Maeda, Yoshihito

62.5-300keV/u H$$_{2}$$$$^{+}$$とC$$_{2}$$$$^{+}$$イオンをビーム軸に対して45$$^{circ}$$傾けた非晶質炭素膜(厚さ2-100$$mu$$g/cm$$^{2}$$)に照射し、膜の前方(下流)と後方(上流)に放出された二次電子収量$$gamma$$$$_{F, B}$$を測定した。前方・後方それぞれにつき、二次電子収量比R$$_{F, B}$$=$$gamma$$$$_{F, B}$$(2)/2$$gamma$$$$_{F, B}$$(1)を用いて、近接効果を評価した。ここで、$$gamma$$$$_{F, B}$$(2)と$$gamma$$$$_{F, B}$$(1)はそれぞれ速度が等しい2原子分子イオン、単原子イオンによる二次電子収量である。観測された近接効果の膜厚依存性と速度依存性をもとに、二次電子収量に対する近接効果の起源を議論する。

62.5-300-keV/u H$$_{2}$$$$^{+}$$ and C$$_{2}$$$$^{+}$$ ions were incident on self-supporting amorphous carbon foils of 2-100 $$mu$$g/cm$$^{2}$$ thickness, which was tilted by 45$$^{circ}$$ to the beam axis. Secondary eletrons (SE) emitted in the forward and backward directions from a carbon foil were detected by two microchannel-plate (MCP) detectors placed at the both sides of the target holder in parallel with the target. Particles transmitted through the foil were detected with a solid-state detector placed at the backside of the target on the beam axis, which made it possible to measure the energy and the number of the transmitted particles. The forward and backward SE yields per incident projectile $$gamma$$$$_{F, B}$$ were determined from the pulse-height distributions of the forward and backward MCP signals, respectively, which are proportional to the number of detected SE's. The vicinage effect was evaluated with the ratios of the forward and backward SE yields R$$_{F, B}$$ = $$gamma$$$$_{F, B}$$(2)/2$$gamma$$$$_{F, B}$$(1), where $$gamma$$$$_{F, B}$$(2) and $$gamma$$$$_{F, B}$$(1) are SE yields induced by bombardment with diatomic and monatomic ions with the same velocity, respectively. The origin of the vicinage effect on the SE yield will be discussed based on the observed foil-thickness and velocity dependence of the vicinage effect.

使用言語

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English

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号

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ページ数

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発行年月

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発表会議名

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18th International Conference on Ion Beam Modifications of Materials (IBMM 2012)

開催年月

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2012/09

開催都市

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Qingdao

開催国

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China

キーワード

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no keyword

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PDF

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研究データの公開先DOI

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使用施設

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TIARA(イオン照射研究施設)

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論文解説記事
(成果普及情報誌)

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- Accesses

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