Instrumental upgrades of the RIXS spectrometer at BL11XU at SPring-8

SPring-8のBL11XUにおけるRIXS分光器の高度化

石井 賢司; Jarrige, I.*; 吉田 雅洋*; 池内 和彦*; 稲見 俊哉; 村上 洋一*; 水木 純一郎

Ishii, Kenji; Jarrige, I.*; Yoshida, Masahiro*; Ikeuchi, Kazuhiko*; Inami, Toshiya; Murakami, Yoichi*; Mizuki, Junichiro

Two recent instrumental upgrades of the inelastic X-ray scattering spectrometer installed at BL11XU at SPring-8 are reported. The first one is a multianalyzer system, where we can simultaneously use three crystal analyzers aligned perpendicularly to the scattering plane. In a test measurement of polycrystalline -PtO, the inelastic spectra obtained with each respective analyzer showed a completely identical lineshape, and a slight difference ( 10%) in intensity. The system enhances the experimental efficiency, and allows for simultaneous scan at three momenta for a single-crystal sample. The second development is a polarization analyzer for the scattered photons. A pyrolytic graphite (PG) crystal is placed in front of the detector and serves as a polarization-analyzer crystal, using the (006) reflection for the Cu -edge. We succeeded to observe clear polarization dependence in the - excitations of KCuF.