検索対象:     
報告書番号:
※ 半角英数字
 年 ~ 
 年

Instrumental upgrades of the RIXS spectrometer at BL11XU at SPring-8

SPring-8のBL11XUにおけるRIXS分光器の高度化

石井 賢司; Jarrige, I.*; 吉田 雅洋*; 池内 和彦*; 稲見 俊哉; 村上 洋一*; 水木 純一郎

Ishii, Kenji; Jarrige, I.*; Yoshida, Masahiro*; Ikeuchi, Kazuhiko*; Inami, Toshiya; Murakami, Yoichi*; Mizuki, Junichiro

Two recent instrumental upgrades of the inelastic X-ray scattering spectrometer installed at BL11XU at SPring-8 are reported. The first one is a multianalyzer system, where we can simultaneously use three crystal analyzers aligned perpendicularly to the scattering plane. In a test measurement of polycrystalline $$alpha$$-PtO$$_2$$, the inelastic spectra obtained with each respective analyzer showed a completely identical lineshape, and a slight difference ($$le$$ 10%) in intensity. The system enhances the experimental efficiency, and allows for simultaneous scan at three momenta for a single-crystal sample. The second development is a polarization analyzer for the scattered photons. A pyrolytic graphite (PG) crystal is placed in front of the detector and serves as a polarization-analyzer crystal, using the (006) reflection for the Cu $$K$$-edge. We succeeded to observe clear polarization dependence in the $$d$$-$$d$$ excitations of KCuF$$_3$$.

Access

:

- Accesses

InCites™

:

パーセンタイル:62.69

分野:Spectroscopy

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.