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Electrically detected magnetic spectroscopy on interface defects in 4H-SiC (000-1) C-face metal-oxide-semiconductor field effect transistors

Umeda, Takahide*; Sato, Yoshihiro*; Arai, Ryo*; Okamoto, Mitsuo*; Harada, Shinsuke*; Kosugi, Ryoji*; Okumura, Hajime*; Makino, Takahiro; Oshima, Takeshi

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