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The Effect of the electron temperature and current density profiles on the plasma current decay in JT-60U disruptions

Shibata, Yoshihide; Isayama, Akihiko; Miyamoto, Seiji*; Kawakami, Sho*; Watanabe, Kiyomasa*; Matsunaga, Go; Kawano, Yasunori; Lukash, V.*; Khayrutdinov, R.*; JT-60 Team

In JT-60U disruption, the plasma current decay during the initial phase of current quench has been calculated by a disruption simulation code (DINA) using the measured electron temperature $$T_{rm e}$$ profile. In the case of fast plasma current decay, $$T_{rm e}$$ has a peaked profile just after thermal quench and the $$T_{rm e}$$ profile doesn't change significantly during the initial phase of current quench. On the other hand, in the case of the slow plasma current decay, the $$T_{rm e}$$ profile is border just after the thermal quench, and the $$T_{rm e}$$ profile shrinks. The results of DINA simulation show that plasma internal inductance $$L_{rm i}$$ increases during the initial phase of current quench, while plasma external inductance $$L_{rm e}$$ does not change in time. The increase of $$L_{rm i}$$ is caused by current diffusion toward the core plasma due to the decrease of $$T_{rm e}$$ in intermediate and edge regions. It is suggested that an additional heating in the plasma periphery region has the effect of slowing down plasma current decay.

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Category:Physics, Fluids & Plasmas

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