The Effect of the electron temperature and current density profiles on the plasma current decay in JT-60U disruptions

Shibata, Yoshihide; Isayama, Akihiko; Miyamoto, Seiji*; Kawakami, Sho*; Watanabe, Kiyomasa*; Matsunaga, Go; Kawano, Yasunori; Lukash, V.*; Khayrutdinov, R.*; JT-60 Team

In JT-60U disruption, the plasma current decay during the initial phase of current quench has been calculated by a disruption simulation code (DINA) using the measured electron temperature profile. In the case of fast plasma current decay, has a peaked profile just after thermal quench and the profile doesn't change significantly during the initial phase of current quench. On the other hand, in the case of the slow plasma current decay, the profile is border just after the thermal quench, and the profile shrinks. The results of DINA simulation show that plasma internal inductance increases during the initial phase of current quench, while plasma external inductance does not change in time. The increase of is caused by current diffusion toward the core plasma due to the decrease of in intermediate and edge regions. It is suggested that an additional heating in the plasma periphery region has the effect of slowing down plasma current decay.