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RBS study of disordering of Fe$$_{3-x}$$Mn$$_{x}$$Si/Ge(111) heteroepitaxial interfaces

Noguchi, Masaya*; Hirata, Tomoaki*; Kawakubo, Yuki*; Narumi, Kazumasa; Sakai, Seiji; Maeda, Yoshihito

We have investigated thermal disordering and instability of Fe$$_{2}$$MnSi (FMS) (111)/Ge(111) heterointerfaces by Rutherford-backscattering spectrometry (RBS), and found pronounced degradation of axial orientation which appears as increase of the minimum yield of RBS when the FMS samples are annealed above 300$$^{circ}$$C. Analysis of interdiffusion at the heterointerface reveals that the disordering mainly comes from interdiffusion between Fe and Ge atoms. This situation is the same as that observed in off-stoichiometric Fe$$_{3}$$Si, ${it i.e.}$, Fe$$_{4}$$Si, but far from that in stoichiometric Fe$$_{3}$$Si.

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