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Cluster-size dependence of secondary-electron yields induced by bombardment of carbon foils with 100's-kev/u cluster ions

数百keV/uクラスターイオン衝撃により誘起される炭素薄膜からの二次電子の収量のクラスターサイズ依存性

鳴海 一雅; 千葉 敦也; 山田 圭介; 的場 史朗; 齋藤 勇一

Narumi, Kazumasa; Chiba, Atsuya; Yamada, Keisuke; Matoba, Shiro; Saito, Yuichi

A vicinage effect on secondary-electron (SE) emissions from a solid induced by swift molecular/cluster ions is one of the open questions of atomic collisions in solids. It cannot be explained by only the production process of the three-step model of SE emissions, which is closely related to the energy deposition by a projectile. We have investigated cluster-size dependence of SE yields emitted in the forward direction from amorphous C foils (2-100 $$mu$$g/cm$$^{2}$$) bombarded with 62.5-keV/u C$$_{{it n}}$$$$^{+}$$ ions ($${it n}$$ = 1-4) in order to demonstrate the vicinage effect not originating from the production process in the present study. Suppression of SE emissions (one of the vicinage effects) is observed and does not diminish in all the foils measured. The suppression effect is larger as the cluster size $${it n}$$ is larger. This dependence is observed for at least 60 $$mu$$g/cm$$^{2}$$, indicating that the effect originating from some physical mechanism exists even at the thick foils, where the contribution of the production process to the effect could be excluded on the basis of previous studies. This can lead to the conclusion that the vicinage effect not originating from the production process is demonstrated experimentally.

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