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Report No.

Effect of helium on irradiation creep behavior of B-doped F82H irradiated in HFIR

Ando, Masami; Nozawa, Takashi; Hirose, Takanori; Tanigawa, Hiroyasu; Wakai, Eiichi  ; Stoller, R. E.*; Myers, J.*

Pressurized tubes of F82H and B-doped F82H irradiated at 573 and 673 K up to $$sim$$6dpa have been measured by a laser profilometer. The irradiation creep strain in F82H irradiated at 573 and 673 K was almost linearly dependent on the effective stress level for stresses below 260 MPa and 170 MPa, respectively. The creep strain of $$^{10}$$BN-F82H was similar to that of F82H IEA at each effective stress level except 294 MPa at 573 K irradiation. For 673 K irradiation, the creep strain of some $$^{10}$$BN-F82H tubes was larger than that of F82H tubes. It is suggested that a swelling caused in each $$^{10}$$BN-F82H because small helium babbles might be produced by a reaction of $$^{10}$$B(n, $$alpha$$) $$^{7}$$Li.



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Category:Nuclear Science & Technology



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