Refine your search�ソスF     
Report No.
 - 

Nanoscale diffusion tracing by radioactive $$^{8}$$Li tracer

Ishiyama, Hironobu*; Jeong, S.-C.*; Watanabe, Yutaka*; Hirayama, Yoshikazu*; Imai, Nobuaki*; Miyatake, Hiroari*; Oyaizu, Mitsuhiro*; Katayama, Ichiro*; Osa, Akihiko  ; Otokawa, Yoshinori  ; Matsuda, Makoto  ; Nishio, Katsuhisa   ; Makii, Hiroyuki   ; Sato, Tetsuya   ; Kuwata, Naoaki*; Kawamura, Junichi*; Nakao, Aiko*; Ueno, Hideki*; Kim, Y. H.*; Kimura, Sota*; Mukai, Momo*

We have developed a nanoscale diffusion measurement method using an $$alpha$$-emitting radioactive $$^{8}$$Li tracer. In this method, while implanting a pulsed 8 keV $$^{8}$$Li beam, the $$alpha$$ particles emitted at a small angle (10$$^{circ}$$) relative to the sample surface were detected as a function of time. The method has been successfully applied to measuring lithium diffusion coefficients for an amorphous Li$$_{4}$$SiO$$_{4}$$-Li$$_{3}$$VO$$_{4}$$ (LVSO) thin film with a thickness of several hundred nanometers, demonstrating that the present method is sensitive to diffusion coefficients down on the order of 10$$^{-12}$$cm$$^{2}$$/s, which is more sensitive by about two orders of magnitude than that previously achieved.

Accesses

:

- Accesses

InCites™

:

Percentile:18.27

Category:Physics, Applied

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.