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Nanoscale diffusion tracing by radioactive $$^{8}$$Li tracer

放射性トレーサー$$^{8}$$Liによるナノスケール拡散

石山 博恒*; Jeong, S.-C.*; 渡辺 裕*; 平山 賀一*; 今井 伸明*; 宮武 宇也*; 小柳津 充広*; 片山 一郎*; 長 明彦; 乙川 義憲; 松田 誠; 西尾 勝久; 牧井 宏之; 佐藤 哲也; 桑田 直明*; 河村 純一*; 中尾 愛子*; 上野 秀樹*; Kim, Y. H.*; 木村 創大*; 向井 もも*

Ishiyama, Hironobu*; Jeong, S.-C.*; Watanabe, Yutaka*; Hirayama, Yoshikazu*; Imai, Nobuaki*; Miyatake, Hiroari*; Oyaizu, Mitsuhiro*; Katayama, Ichiro*; Osa, Akihiko; Otokawa, Yoshinori; Matsuda, Makoto; Nishio, Katsuhisa; Makii, Hiroyuki; Sato, Tetsuya; Kuwata, Naoaki*; Kawamura, Junichi*; Nakao, Aiko*; Ueno, Hideki*; Kim, Y. H.*; Kimura, Sota*; Mukai, Momo*

We have developed a nanoscale diffusion measurement method using an $$alpha$$-emitting radioactive $$^{8}$$Li tracer. In this method, while implanting a pulsed 8 keV $$^{8}$$Li beam, the $$alpha$$ particles emitted at a small angle (10$$^{circ}$$) relative to the sample surface were detected as a function of time. The method has been successfully applied to measuring lithium diffusion coefficients for an amorphous Li$$_{4}$$SiO$$_{4}$$-Li$$_{3}$$VO$$_{4}$$ (LVSO) thin film with a thickness of several hundred nanometers, demonstrating that the present method is sensitive to diffusion coefficients down on the order of 10$$^{-12}$$cm$$^{2}$$/s, which is more sensitive by about two orders of magnitude than that previously achieved.

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パーセンタイル:78.29

分野:Physics, Applied

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