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Pinpoint Analysis of Cs-contained Vermiculite using Synchrotron Radiation PEEM

Yoshigoe, Akitaka ; Shiwaku, Hideaki  ; Kobayashi, Toru ; Shimoyama, Iwao  ; Matsumura, Daiju  ; Tsuji, Takuya ; Nishihata, Yasuo; Yaita, Tsuyoshi; Kogure, Toshihiro*; Motai, Satoko*; Okochi, Takuo*; Yasui, Akira*

Pinpoint chemical analysis for Cs-adsorbed vermiculite was performed by using synchrotron radiation photoelectron emission microscopy (SR-PEEM). It was found that Cs is distributed through the micro-size clay particles and we also succeeded to measure pinpoint X-ray absorption spectra for constituent element simultaneously. Furthermore, we precisely confirmed the existence of Fe in the sample.

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