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Status of simultaneous multiple incident band measurement method for broadband micro eV spectrum measurement on the Si crystal analyzer back scattering TOF spectrometer DNA at J-PARC

Shibata, Kaoru  ; Kawakita, Yukinobu  ; Nakajima, Kenji  ; Takahashi, Nobuaki*; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*

We developed a simultaneous multiple incident band measurement method for broadband micro eV spectrum measurement on the Si crystal analyzer back scattering TOF spectrometer DNA at J-PARC.

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