Analysis of molecular orientation for organic semiconductor using photo electron emission microscope with excitation sources of linear-polarized X-rays and ultraviolet light

Sekiguchi, Tetsuhiro  ; Honda, Mitsunori   ; Hirao, Norie; Ikeura, Hiromi*

High degrees of molecular orientation play a crucial role in the improvement of electronic properties in organic semiconductors. Thus, it is essential to selectively characterize materials with different orientation direction in microscopic domains. So far, we have strived to observe orientation of organic-semiconductors in microscopic domains using the photoelectron emission microscopy (PEEM) system with excitation by linearly polarized ultraviolet (UV) light from mercury lamp and synchrotron X-rays.