Refine your search:     
Report No.
 - 

The Development of a non-destructive analysis system with negative muon beam for industrial devices at J-PARC MUSE

Tampo, Motonobu*; Hamada, Koji*; Kawamura, Naritoshi*; Inagaki, Makoto*; Ito, Takashi; Kojima, Kenji*; Kubo, Kenya*; Ninomiya, Kazuhiko*; Strasser, P.*; Yoshida, Go*; Miyake, Yasuhiro*

We developed a low-background muonic X-ray measurement system for nondestructive elemental depth-profiling analysis. A test experiment was performed using a multi-layered sample (34-$$mu$$m Al/140-$$mu$$m C/70-$$mu$$m Cu/500$$mu$$m LiF) and characteristic muonic X-rays from $$mu$$C, $$mu$$Cu, and $$mu$$F in the sample were successfully identified. A comparison was made between the relative intensity of the characteristic muonic X-rays and simulated muon depth profiles for several muon implantation energies.

Accesses

:

- Accesses

InCites™

:

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.