Tampo, Motonobu*; Hamada, Koji*; Kawamura, Naritoshi*; Inagaki, Makoto*; Ito, Takashi 
; Kojima, Kenji*; Kubo, Kenya*; Ninomiya, Kazuhiko*; Strasser, P.*; Yoshida, Go*; Miyake, Yasuhiro*
We developed a low-background muonic X-ray measurement system for nondestructive elemental depth-profiling analysis. A test experiment was performed using a multi-layered sample (34-
m Al/140-m C/70-m Cu/500m LiF) and characteristic muonic X-rays from C, Cu, and F in the sample were successfully identified. A comparison was made between the relative intensity of the characteristic muonic X-rays and simulated muon depth profiles for several muon implantation energies.
Language |
: | English |
|---|---|---|
Journal |
: | |
Volume |
: | 8 |
Number |
: | |
Pages |
: | p.036016_1 - 036016_6 |
Publication Year/Month |
: | 2015/09 |
Meeting title |
: | 2nd International Symposium on Science at J-PARC (J-PARC 2014) |
Held date |
: | 2014/07 |
Location (city) |
: | Tsukuba |
Location (country) |
: | Japan |
Paper URL |
: |
|
Keywords |
: | no keyword |
Research Facility |
: |
Accesses |
: |
- Accesses |
|---|---|---|
Altmetrics |
: |
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