Development of simultaneous multiple incident band measurement method for broadband energy spectrum measurement on the Si crystal analyzer back scattering TOF spectrometer DNA at J-PARC

Shibata, Kaoru ; Takahashi, Nobuaki*; Kawakita, Yukinobu ; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*; Nakajima, Kenji ; Kobayashi, Makoto*; Inamura, Yasuhiro

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Language	:	Japanese
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Meeting title	:	日本物理学会2015年秋季大会(物性)
Held date	:	2015/09
Location (city)	:	吹田
Location (country)	:	日本
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Keywords	:	Inelastic Neutron Scattering Spectrometer; Backscattering; Pulsed Neutron Techniques; Si crystal analyzer
Research Facility	:	J-PARC物質・生命科学実験施設
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Registration No. : BB20152838
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