検索対象:     
報告書番号:
※ 半角英数字
 年 ~ 
 年

Uniform Si nano-dot fabrication using reconstructed structure of Si(110)

Si(110)上再構成構造を利用した規定された形状のSiナノドットの作製

矢野 雅大   ; 魚住 雄輝*; 保田 諭   ; 朝岡 秀人  

Yano, Masahiro; Uozumi, Yuki*; Yasuda, Satoshi; Asaoka, Hidehito

We have observed oxide decomposition process on Si(110). We have succeeded to observe metastable area and state by means of scanning tunneling microscope (STM) and X-ray photoemission spectroscopy (XPS), respectively.

Access

:

- Accesses

InCites™

:

パーセンタイル:19.87

分野:Physics, Applied

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.