Time evolution of morphology and electronic state of oxidized Si(110) during reduction process

Yano, Masahiro ; Uozumi, Yuki*; Yasuda, Satoshi ; Asaoka, Hidehito

We have observed time evolution of morphology and electronic state of oxide Si(110) during reduction process. We found metastable area and state by means of scanning tunneling microscope (STM) and X-ray photoemission spectroscopy (XPS), respectively.

Language	:	English
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Meeting title	:	25th International Colloquium on Scanning Probe Microscopy (ICSPM-25)
Held date	:	2017/12
Location (city)	:	Atagawa
Location (country)	:	Japan
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Keywords	:	Si(110); Metastable States; Nanostructures
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Registration No. : BB20171545
JAEA Abstracts No. :
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