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Report No.

Analysis of carbon thin films by laser Raman method

Kinsho, Michikazu ; Kamiya, Junichiro  ; Koizumi, Oji*; Nasu, Shogo*

Crystallinity, crystalline structure and internal force of thin films were measured by Laser Raman spectroscopy for the purpose of analyzing the fracture mechanism of the charge exchange foil due to beam hitting in this study. Thin films were used four types of HBC foil, pure carbon film (C foil) formed by arc discharge method, graphene, and carbon nanotube (CNT foil). As a result of changing the laser output and measuring the Raman peak shift of each foil, the HBC foil and the C foil had large Raman peak shift change, the D-band was negative and the G-band was opposite sign with positive. On the other hand, the graphene and the CNT foil showed small change in Raman peak shift, and both D-band and G-band were negative. From these results, it was found that a large stress occurs in the HBC foil and the C foil due to the heat load by the laser which was used for Raman spectrum measurements.



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