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Quantitative characterization of the nanoscale local lattice strain induced by Sr dopants in La$$_{1.92}$$Sr$$_{0.08}$$CuO$$_{4}$$

La$$_{1.92}$$Sr$$_{0.08}$$CuO$$_{4}$$中のSrにより生じるナノスケール局所格子歪みの定量的観測

Lin, J. Q.*; Liu, X.*; Blackburn, E.*; 脇本 秀一; Ding, H.*; Islam, Z.*; Sinha, S. K.*

Lin, J. Q.*; Liu, X.*; Blackburn, E.*; Wakimoto, Shuichi; Ding, H.*; Islam, Z.*; Sinha, S. K.*

X線散漫散乱の観測により、銅酸化物高温超伝導体La$$_{2-x}$$Sr$$_{x}$$CuO$$_{4}$$中の不純物Srにより生じるナノスケールの格子歪みを観測した。この結果は、これまで議論となっていた不純物による歪みの性質を明らかにしたとともに、STMで観測されているギャップの不均一性の原因ではないことを明らかにした。

The nanometer scale lattice deformation brought about by the dopants in the high temperature superconducting cuprate La$$_{2-x}$$Sr$$_{x}$$CuO$$_{4}$$ $$(x=0.08)$$ was investigated by measuring the associated X-ray diffuse scattering around multiple Bragg peaks. Our results address the long-term concern of dopant introduced local lattice inhomogeneity, and show that the associated nanometer scale lattice deformation is marginal and cannot be responsible for the patched variation in the spectral gaps observed with scanning tunneling microscopy in the cuprates.

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パーセンタイル:100

分野:Physics, Multidisciplinary

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