Study of the neutron absorbers materials coated on the back side of analyzer silicon crystal wafer

Shibata, Kaoru

The silicon crystal analyzer is an important spectroscopic device for high energy resolution neutron inelastic backscattering spectrometer. Specification of this spectroscopic device is thought to determine energy resolution and background. In order to achieve a low background spectrum without degradation of the energy resolution, it was developed new crystal analyzer which were constracted by Si wafers coated by thin film of neutron absorbers on the back side of Si wafer, and used it for the new backscattering spectrometer DNA in MLF at J-PARC which were able to achieve the desired performance.

Language	:	English
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Meeting title	:	23rd Meeting of the International Collaboration on Advanced Neutron Sources (ICANS-23)
Held date	:	2019/10
Location (city)	:	Chattanooga
Location (country)	:	U.S.A.
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Keywords	:	analyzer crystal silicon wafer; low background spectrum; Backscattering Neutron Spectrometer
Research Facility	:	J-PARC物質・生命科学実験施設
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Registration No. : BB20191681
JAEA Abstracts No. :
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