Characterization of precipitated phase in Cu-Ni-Si alloy by small-angle X-ray scattering, small angle neutron scattering and atom probe tomography

Sasaki, Hirokazu*; Akiya, Shunta*; Oba, Yojiro ; Onuma, Masato*; Giddings, A. D.*; Okubo, Tadakatsu*

Copper-Nickel-Silicon (Cu-Ni-Si) alloys have excellent electric conductivity and mechanical properties due to nanosized Nickel-Silicon precipitates dispersed in Copper matrix. In this study, small-angle X-ray scattering (SAXS), small-angle neutron scattering (SANS), and atom probe tomography were used to characterize the Ni-Si precipitates for further improvement of Cu-Ni-Si alloys. We obtained nanostructural information about the size, shape, chemical composition, and their changes during heat treatment.

Language	:	English
Journal	:	Materials Transactions
Volume	:	63
Number	:	10
Pages	:	p.1384 - 1389
Publication Year/Month	:	2022/10
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Paper URL	:	https://doi.org/10.2320/matertrans.MT-D2022003
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Registration No. : AA20210763
JAEA Abstracts No. : 50001106
Paper Submission No. : 25867

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