Characterization of precipitated phase in Cu-Ni-Si alloy by small-angle X-ray scattering, small angle neutron scattering and atom probe tomography

X線・中性子小角散乱法及び3次元アトムプローブ法によるCu-Ni-Si合金中の析出相の解析

佐々木 宏和*; 秋谷 俊太*; 大場 洋次郎  ; 大沼 正人*; Giddings, A. D.*; 大久保 忠勝*

Sasaki, Hirokazu*; Akiya, Shunta*; Oba, Yojiro; Onuma, Masato*; Giddings, A. D.*; Okubo, Tadakatsu*

Copper-Nickel-Silicon (Cu-Ni-Si) alloys have excellent electric conductivity and mechanical properties due to nanosized Nickel-Silicon precipitates dispersed in Copper matrix. In this study, small-angle X-ray scattering (SAXS), small-angle neutron scattering (SANS), and atom probe tomography were used to characterize the Ni-Si precipitates for further improvement of Cu-Ni-Si alloys. We obtained nanostructural information about the size, shape, chemical composition, and their changes during heat treatment.